%PDF-1.5
%
1 0 obj
<>stream
application/pdfIEEE2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2018; ; ; Methodology to Generate Approximate Circuits to Reduce Process Induced Degradation in CNFET Based CircuitsKaship SheikhLan Wei
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)360 Sept. 2018363
endstream
endobj
2 0 obj
<>stream
x߿ ,
endstream
endobj
3 0 obj
<>stream
hTSϏEށ*!E$D{cELn$ !twuWWUWWuua!.ѣ/3Kb
7ߗJ*ZKǖZ;W|W/}{ֵ[>[}}Z=}>?oNxs)~v['}x_yw;W7]y.Z/{|~.v__ίX]9xO{~0{ytva=VnzCJ}#> HCcBPDЀIb1̈ň4e 3SRaTrE
RUۉ#ve C8D8IlH\(R5$ In%Ks;g\0>?Ӥb,DzR fxXjX(,,0}HidGXF$4a`,dFaI fL3.