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application/pdfIEEE2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2018; ; ; Multi-Subband Ensemble Monte Carlodirect Source-to-Drain tunnelingbiaxial strainFinFETImpact of Strain on S/D tunneling in FinFETs: a MS-EMC studyCristina Medina-BailonCarlos SampedroJose Luis PadillaAndres GodoyLuca DonettiVihar P. GeorgievFrancisco GamizAsen Asenov
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)301 Sept. 2018304
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