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application/pdfIEEE2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2018; ; ; NBTIJunctionless NanowireReliabilityTCAD SimulationAnalog CircuitCurrent MirrorOn the NBTI of Junction-less Nanowire and Novel Operation Scheme to Minimize NBTI Degradation in Analog CircuitsHiu Yung WongMunkang ChoiRavi TiwariSouvik Mahapatra
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)172 Sept. 2018175
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