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application/pdfIEEE2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2018; ; ; Modelling on Aging Induced Time Dependent Variability of Z2FET for Memory ApplicationsM. DuanB. ChengC. Medina BailonF Adamu-LemaP. AsenovC. MillarP. PfaeffliA. Asenov
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)119 Sept. 2018122
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